Backscattered and Secondary Electron Emission as Ancillary Techniques in Electron Probe Analysis
- 1 January 1969
- book chapter
- Published by Elsevier
Abstract
No abstract availableThis publication has 11 references indexed in Scilit:
- Back Scattering of ElectronsJournal of Applied Physics, 1961
- Contribution of Backscattered Electrons to Secondary Electron FormationPhysical Review B, 1961
- Electron Probe MicroanalysisPublished by Elsevier ,1960
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- Backscattering of 5–20 kev Electrons from Insulators and MetalsJournal of Applied Physics, 1957
- Theory of Secondary EmissionPhysical Review B, 1957
- The scanning electron microscope and its fields of applicationBritish Journal of Applied Physics, 1955
- Secondary Electron Emission and Atomic Shell StructurePhysical Review B, 1950
- A Theory of Secondary Electron Emission from MetalsPhysical Review B, 1950
- Secondary Electron EmissionPublished by Elsevier ,1948