A novel approach to image processing in spin-polarized electron microscopy
- 1 November 1989
- journal article
- Published by AIP Publishing in Review of Scientific Instruments
- Vol. 60 (11) , 3430-3433
- https://doi.org/10.1063/1.1140540
Abstract
No abstract availableKeywords
This publication has 10 references indexed in Scilit:
- Hochauflösende Abbildung magnetischer OberflächenstrukturenPhysikalische Blätter, 1988
- High Resolution Imaging of MagnetizationMRS Bulletin, 1988
- New methods for image collection and analysis in scanning Auger microscopyJournal of Vacuum Science & Technology A, 1985
- HIGH RESOLUTION MAGNETIC MICROSTRUCTURE IMAGING USING SECONDARY ELECTRON SPIN POLARIZATION ANALYSIS IN A SCANNING ELECTRON MICROSCOPEJournal of Microscopy, 1985
- Fine structure in electron channelling patternsJournal of Microscopy, 1985
- Spin-Polarized Scanning Electron Microscope for Magnetic Domain ObservationJapanese Journal of Applied Physics, 1985
- The investigation of magnetic domain structures in thin foils by electron microscopyJournal of Physics D: Applied Physics, 1984
- Spin and Energy Analyzed Secondary Electron Emission from a FerromagnetPhysical Review Letters, 1982
- Electron spin polarization of secondary electrons ejected from magnetized europium oxidePhysics Letters A, 1976
- Observation of Magnetic Domains by the Kerr EffectPhysical Review B, 1951