Submicron trackwidth and stripe height MR sensor test structures
- 1 January 1996
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Magnetics
- Vol. 32 (5) , 3440-3442
- https://doi.org/10.1109/20.538650
Abstract
No abstract availableThis publication has 6 references indexed in Scilit:
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