1/f noise measurements for characterizing multispot low-Ohmic contacts
- 1 May 1976
- journal article
- conference paper
- Published by AIP Publishing in Journal of Applied Physics
- Vol. 47 (5) , 2056-2058
- https://doi.org/10.1063/1.322935
Abstract
The patchiness of contacts can be determined from measurements of 1/f noise and contact resistance on a number of contacts of different diameters made by the same method. If a contact consists of k conducting spots with average radius a, k and a can be determined if the distance between the spot centers is at least 2.5 times the spot diameter. Using the developed multispot contact model, the results of the 1/f noise analysis are in good agreement with multispot parameters obtained from microscopic investigations.This publication has 7 references indexed in Scilit:
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