A deep-submicrometer analog-to-digital converter using focused-ion-beam implants
- 1 April 1990
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Journal of Solid-State Circuits
- Vol. 25 (2) , 562-571
- https://doi.org/10.1109/4.52185
Abstract
No abstract availableKeywords
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