Temperature and thickness dependence of the Ohmic and thermoelectric behaviour of Cu-Ni thin films of constantan type obtained by controlled UHV co-evaporation
- 15 July 1976
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 36 (1) , 55-59
- https://doi.org/10.1016/0040-6090(76)90398-9
Abstract
No abstract availableKeywords
This publication has 1 reference indexed in Scilit:
- On the temperature dependence of electrical resistivit in concentrated disordered transition binary alloysJournal de Physique Lettres, 1975