Atomic-scale variations in contact potential difference on Au/Si(111) 7×7 surface in ultrahigh vacuum
- 1 April 2000
- journal article
- Published by Elsevier in Applied Surface Science
- Vol. 157 (4) , 222-227
- https://doi.org/10.1016/s0169-4332(99)00530-9
Abstract
No abstract availableThis publication has 3 references indexed in Scilit:
- High resolution imaging of contact potential difference using a novel ultrahigh vacuum non-contact atomic force microscope techniqueApplied Surface Science, 1999
- High-resolution imaging of contact potential difference with ultrahigh vacuum noncontact atomic force microscopeApplied Physics Letters, 1998
- High resolution atomic force microscopy potentiometryJournal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 1991