Application of spectroscopic ellipsometry to probe the environmental and photo-oxidative degradation of poly(p-phenylenevinylene) (PPV)
- 9 October 2003
- journal article
- Published by Elsevier in Synthetic Metals
- Vol. 139 (3) , 751-753
- https://doi.org/10.1016/s0379-6779(03)00317-5
Abstract
No abstract availableKeywords
This publication has 9 references indexed in Scilit:
- Photo and photo-oxidative degradations of poly(phenylene vinylene) derivativesThin Solid Films, 2002
- Optical properties of highly oriented poly(p-phenylene-vinylene)Synthetic Metals, 2001
- Environmental aging of poly(p-phenylenevinylene) based light-emitting diodesSynthetic Metals, 2000
- Interference effects in anisotropic optoelectronic devicesJournal of Applied Physics, 2000
- Failure phenomena and mechanisms of polymeric light-emitting diodes: Indium–tin–oxide damageApplied Physics Letters, 1996
- Photo-oxidation of electroluminescent polymers studied by core-level photoabsorption spectroscopyApplied Physics Letters, 1996
- Photodegradation of poly(p - phenylenevinylene) by laser light at the peak wavelength of electroluminescenceApplied Physics Letters, 1995
- Luminescence Enhancement by the Introduction of Disorder into Poly( p -phenylene vinylene)Science, 1995
- Light-emitting diodes based on conjugated polymersNature, 1990