Implications of high resolution to near-field optical microscopy
- 1 March 1998
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 71 (1-4) , 341-344
- https://doi.org/10.1016/s0304-3991(97)00066-1
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
- Facts and artifacts in near-field optical microscopyJournal of Applied Physics, 1997
- Allowed and forbidden light in near-field optics I A single dipolar light sourceJournal of the Optical Society of America A, 1997
- Dielectric versus topographic contrast in near-field microscopyJournal of the Optical Society of America A, 1996
- “Tunnel” near-field optical microscopy: TNOM-2Ultramicroscopy, 1995
- Influence of dielectric contrast and topography on the near field scattered by an inhomogeneous surfaceJournal of the Optical Society of America A, 1995