Influence of dielectric contrast and topography on the near field scattered by an inhomogeneous surface
- 1 December 1995
- journal article
- Published by Optica Publishing Group in Journal of the Optical Society of America A
- Vol. 12 (12) , 2716-2725
- https://doi.org/10.1364/josaa.12.002716
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
This publication has 31 references indexed in Scilit:
- Surface profile reconstruction using near-field dataOptics Communications, 1995
- Analysis of photon-scanning tunneling microscope images of inhomogeneous samples: determination of the local refractive index of channel waveguidesJournal of the Optical Society of America A, 1995
- Scanning near-field optical microscopyApplied Physics A, 1994
- Near-field optics inverse-scattering reconstruction of reflective surfacesOptics Letters, 1993
- Imaging of submicron index variations by scanning optical tunnelingJournal of Vacuum Science & Technology B: Microelectronics and Nanometer Structures, 1992
- Near-field differential scanning optical microscope with atomic force regulationApplied Physics Letters, 1992
- Combined shear force and near-field scanning optical microscopyApplied Physics Letters, 1992
- Scanning-tunneling optical microscopy: a theoretical macroscopic approachJournal of the Optical Society of America A, 1992
- Observation of optical waveguides by using a photon scanning tunneling microscopeJournal of Optics, 1992
- Inverse scattering: an iterative numerical method for electromagnetic imagingIEEE Transactions on Antennas and Propagation, 1991