Impact of disorder on high quality factor III-V nitride microcavities
- 25 December 2006
- journal article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 89 (26) , 261101
- https://doi.org/10.1063/1.2420788
Abstract
The authors report on the micron scale characterization of a monolithic GaN microcavity (MC) with lattice matched distributed Bragg reflectors by means of a microtransmission setup. This technique allows extracting very high quality factors ( up to 2800), in accordance with theoretical predictions, contrary to what was previously reported for nitride based MCs. Furthermore, two-dimensional mappings of the MC transmission spectrum allow probing the disorder in this MC. The direct relationship between an increased disorder and a reduction in the factor is clearly observed.
Keywords
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