Reliability and failure analysis of GaAs mesfets on GaAs and Si substrates
- 1 July 1991
- journal article
- research article
- Published by Wiley in Quality and Reliability Engineering International
- Vol. 7 (4) , 323-329
- https://doi.org/10.1002/qre.4680070419
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Antiphase domains in GaAs grown by metalorganic chemical vapor deposition on silicon-on-insulatorJournal of Applied Physics, 1988
- Ohmic contacts to III–V compound semiconductors: A review of fabrication techniquesSolid-State Electronics, 1983
- Localized GaAs Etching with Acidic Hydrogen Peroxide SolutionsJournal of the Electrochemical Society, 1981
- Current saturation and small-signal characteristics of GaAs field-effect transistorsIEEE Transactions on Electron Devices, 1973