The determination of lattice parameters and strains in stressed thin films using X-ray diffraction with Seeman-Bohlin focusing
- 1 February 1985
- journal article
- Published by Elsevier in Thin Solid Films
- Vol. 124 (3-4) , 283-291
- https://doi.org/10.1016/0040-6090(85)90278-0
Abstract
No abstract availableKeywords
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