Scanning tunneling microscopy of an ion-bombarded PbS(001) surface
- 21 November 1988
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 53 (21) , 2039-2041
- https://doi.org/10.1063/1.100312
Abstract
Freshly cleaved (001) surfaces of single crystalline PbS were bombarded by 8 keV Kr+ ions at a dose of 3×1012 cm−2. Atomically resolved scanning tunneling microscopy (STM) images were taken showing damaged areas due to individual ion impacts. Analysis of a STM image shows a shallow impact crater, a stacking fault, displacement of Pb2+ and S2− ions from their regular surface sites, and migration of interstitials to the surface.Keywords
This publication has 8 references indexed in Scilit:
- Effects of isolated atomic collision cascades on/Si interfaces studied by scanning tunneling microscopyPhysical Review B, 1988
- Scanning tunneling microscopy of β-SiC and YBa2Cu3O7−x ceramic surfacesJournal of Vacuum Science & Technology A, 1988
- Defect-cluster formation in high-energy-density cascades in goldPhilosophical Magazine A, 1988
- An x-ray photoelectron spectroscopic study of the oxidation of galenaApplications of Surface Science, 1984
- A comparison of secondary ion and photon yields from ion bombarded CuNi alloysSurface Science, 1984
- Electronic properties of clean and oxygen covered (100) cleaved surfaces of PbSSurface Science, 1980
- Computer simulation of atomic-displacement cascades in solids in the binary-collision approximationPhysical Review B, 1974
- Electronic Structure of PbS, PbSe, and PbTePublished by Elsevier ,1974