Measurement of Fowler-Nordheim tunneling currents in MOS structures under charge trapping conditions
- 31 July 1985
- journal article
- Published by Elsevier in Solid-State Electronics
- Vol. 28 (7) , 717-720
- https://doi.org/10.1016/0038-1101(85)90022-x
Abstract
No abstract availableThis publication has 8 references indexed in Scilit:
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