Compositional Studies of Semiconductor Alloys by Bright Field Electron Microscope Imaging of Wedged Crystals

This publication has 6 references indexed in Scilit:

• Composition Dependence of Equal Thickness Fringes in an Electron Microscope Image of GaAs/Al_xGa_1-x As Multilayer Structure
  Japanese Journal of Applied Physics, 1985
• HREM Profile Image Interpretation In MgO Cubes
  Proceedings, annual meeting, Electron Microscopy Society of America, 1985
• Bloch waves and their corresponding atomic and molecular orbitals in high energy electron diffraction
  Philosophical Magazine A, 1978
• Absolute structure determination with electron microscopy
  Acta Crystallographica Section A, 1977
• Absorption parameters in electron diffraction theory
  Philosophical Magazine, 1968
• Electron Microscope Study on the Extinction and Absorption of 100 kV Electrons in Magnesium Oxide Single Crystals
  Japanese Journal of Applied Physics, 1965