A Position-Sensitive Proportional Counter for Residual Stress Measurement by Means of Microbeam X-Rays

Publisher Website

1 January 1980

book chapter
Published by Springer Nature

p. 325-330
https://doi.org/10.1007/978-1-4613-3096-7_42

Abstract

No abstract available

This publication has 1 reference indexed in Scilit:

Study on X-Ray Stress Analysis Using a New Position-Sensitive Proportional Counter
Advances in X-ray Analysis, 1978