Interconnect testing for bus-structured systems
- 31 December 2002
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 3 references indexed in Scilit:
- A unified theory for designing optimal test generation and diagnosis algorithms for board interconnectsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Diagnosis for wiring interconnectsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- Testing for Faults in Wiring NetworksIEEE Transactions on Computers, 1974