X-ray photoelectron diffraction (XPED) patterns from: III-V compound mixed crystals (Ga1-xAlxAs AND GaAs1-yPy). Comparison of experiment and single scattering calculations
- 31 December 1984
- journal article
- Published by Elsevier in Journal of Electron Spectroscopy and Related Phenomena
- Vol. 34 (3) , 215-224
- https://doi.org/10.1016/0368-2048(84)80066-3
Abstract
No abstract availableKeywords
This publication has 24 references indexed in Scilit:
- Photoelectron diffraction effects in XPS angular distributions from GaAs(110) and Ge(110) single crystalsJournal of Electron Spectroscopy and Related Phenomena, 1981
- Estimation of Surface Crystal Regularity by Utilizing X-Ray Photoelectron Diffraction (XPED) EffectsJapanese Journal of Applied Physics, 1980
- Angle-Resolved X-Ray Photoelectron Spectroscopy (ARXPS) as a New Tool for Solid Surface CharacterizationProceedings of the Japan Academy, Series B, 1980
- Structure of the LaB (001) surface studied by angle-resolved XPS and LEEDJournal of Applied Physics, 1978
- X-ray photoelectron diffraction: a new technique for structural studies of complex solidsJournal of the American Chemical Society, 1978
- ESCA Studies of the Clean Si (111) SurfacePhysica Scripta, 1977
- Angular-dependent x-ray-photoelectron peak intensities from single-crystal goldPhysical Review B, 1977
- Theoretical electron scattering amplitudes and spin polarizations: Electron energies 100 to 1500 eV Part III. Li, Na, Mg, P, K, Ca, Sc, Mn, Ga, Br, Sr, Mo, Rh, Cd, Ba, W, and Os targetsAtomic Data and Nuclear Data Tables, 1974
- Theoretical electron scattering amplitudes and spin polarizations: Electron energies 100 to 1500 eV Part II. Be, N, O, Al, Cl, V, Co, Cu, As, Nb, Ag, Sn, Sb, I, and Ta targetsAtomic Data and Nuclear Data Tables, 1972
- Theoretical electron scattering amplitudes and spin polarizations: Selected targets, electron energies 100 to 1500 eVAtomic Data and Nuclear Data Tables, 1969