GLFSR-a new test pattern generator for built-in-self-test
- 17 December 2002
- conference paper
- Published by Institute of Electrical and Electronics Engineers (IEEE)
Abstract
No abstract availableKeywords
This publication has 9 references indexed in Scilit:
- SHIFT REGISTERS DESIGNED FOR ON-LINE FAULT DETECTIONPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2005
- Fault detection effectiveness of weighted random patternsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2003
- Analysis of cellular automata used as pseudorandom pattern generatorsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,2002
- A new framework for designing and analyzing BIST techniques and zero aliasing compressionIEEE Transactions on Computers, 1991
- An analysis of the aliasing probability of multiple-input signature registers in the case of a 2/sup m/-ary symmetric channelIEEE Transactions on Computer-Aided Design of Integrated Circuits and Systems, 1990
- Design considerations for Parallel pseudoRandom Pattern GeneratorsJournal of Electronic Testing, 1990
- Two-level coding for error control in magnetic disk storage productsIBM Journal of Research and Development, 1989
- Parallel random number generation for VLSI systems using cellular automataIEEE Transactions on Computers, 1989
- Pseudorandom TestingIEEE Transactions on Computers, 1987