Design considerations for Parallel pseudoRandom Pattern Generators
- 1 February 1990
- journal article
- Published by Springer Nature in Journal of Electronic Testing
- Vol. 1 (1) , 73-87
- https://doi.org/10.1007/bf00134016
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
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- Design of universal test sequences for VLSIIEEE Transactions on Information Theory, 1985
- Fast evaluation of logarithms in fields of characteristic twoIEEE Transactions on Information Theory, 1984
- Exhaustive Generation of Bit Patterns with Applications to VLSI Self-TestingIEEE Transactions on Computers, 1983