The growth of Ag monolayers on a polycrystalline (111) Al surface

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Abstract
The growth of silver thin films on polycrystalline (111) aluminium surfaces is studied by Auger electron spectroscopy, resistivity measurements and surface reflectance spectroscopy. It is demonstrated that a small quantity of Ag atoms (about two monolayers) migrate in the Al grain boundaries. Then the Ag film grows in a continuous way on the substrate. The top of the d bands in the silver continuous monolayer is deeper with respect to the Fermi level than in the bulk. It shifts towards the Fermi level when the film thickness increases and reaches its bulk position for the internal monolayers of thicker films.