The Entropy of Defects and Diffusion in Silicon
- 1 January 1985
- journal article
- Published by Springer Nature in MRS Proceedings
Abstract
No abstract availableKeywords
This publication has 7 references indexed in Scilit:
- Microscopic Theory of Impurity-Defect Reactions and Impurity Diffusion in SiliconPhysical Review Letters, 1985
- Migration of interstitials in siliconPhysical Review B, 1984
- Silicon self-interstitial migration: Multiple paths and charge statesPhysical Review B, 1984
- Microscopic Theory of Atomic Diffusion Mechanisms in SiliconPhysical Review Letters, 1984
- Barrier to Migration of the Silicon Self-InterstitialPhysical Review Letters, 1984
- Point Defects in Semiconductors IPublished by Springer Nature ,1981
- Thermal Properties of the Inhomogeneous Electron GasPhysical Review B, 1965