Surface-limited resistivity in 2D-semiconductors and 2D-metals: Influence of roughness modeling
- 2 April 1990
- journal article
- Published by Elsevier in Surface Science
- Vol. 229 (1-3) , 110-112
- https://doi.org/10.1016/0039-6028(90)90846-z
Abstract
No abstract availableKeywords
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