EFFECT OF SURFACE SCATTERING ON ELECTRON MOBILITY IN AN INVERSION LAYER ON p-TYPE SILICON
- 15 April 1964
- journal article
- research article
- Published by AIP Publishing in Applied Physics Letters
- Vol. 4 (8) , 145-147
- https://doi.org/10.1063/1.1754005
Abstract
No abstract availableThis publication has 5 references indexed in Scilit:
- An investigation of surface states at a silicon/silicon oxide interface employing metal-oxide-silicon diodesSolid-State Electronics, 1962
- The TFT A New Thin-Film TransistorProceedings of the IRE, 1962
- Semiconductor Surface VaractorBell System Technical Journal, 1962
- Effective Carrier Mobility in Surface-Space Charge LayersPhysical Review B, 1955
- Modulation of Conductance of Thin Films of Semi-Conductors by Surface ChargesPhysical Review B, 1948