Hrem of Defects in Silicon at Twin Intersections
- 1 January 1990
- journal article
- Published by Springer Nature in MRS Proceedings
Abstract
No abstract availableKeywords
This publication has 9 references indexed in Scilit:
- Hexagotnal Silicon: A New Hrem StudyMRS Proceedings, 1989
- Structure determination of planar defects in crystals of germanium and molybdenum by HREMActa Crystallographica Section A Foundations of Crystallography, 1988
- Hexagonal Silicon, a Stress-Induced Martesitic TransformationMRS Proceedings, 1987
- Crystal data for high-pressure phases of siliconPhysical Review B, 1986
- The importance of beam alignment and crystal tilt in high resolution electron microscopyUltramicroscopy, 1983
- On the diamond-cubic to hexagonal phase transformation in siliconPhilosophical Magazine A, 1981
- Microscopic Theory of the Phase Transformation and Lattice Dynamics of SiPhysical Review Letters, 1980
- Electron microscope investigation of the microplastic deformation mechanisms of silicon by indentationPhysica Status Solidi (a), 1972
- Growth of the Cellular Slime Mold Polysphondylium pallidum in a Simple Nutrient MediumScience, 1963