Dielectronic-Recombination Cross-Section Measurements forIons
- 31 January 1983
- journal article
- research article
- Published by American Physical Society (APS) in Physical Review Letters
- Vol. 50 (5) , 335-338
- https://doi.org/10.1103/physrevlett.50.335
Abstract
With use of a merged electron-ion beam apparatus, a lower limit of dielectronic recombination cross section for has been obtained from 9.04 to 9.32 eV. The measured cross section exceeds the theoretically predicted value by more than a factor of 3. This lies well outside the stated experimental and theoretical uncertainties.
Keywords
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