An X-Ray Spectrometer for Pixel Analysis of Art Objects
- 1 January 1991
- journal article
- Published by Cambridge University Press (CUP) in Advances in X-ray Analysis
- Vol. 35 (B) , 987-993
- https://doi.org/10.1154/s0376030800013215
Abstract
An x-ray spectrometer has been designed for pixel by pixel analysis along lines or across selected areas of paintings and other art-objects. Characteristic technical data are: 0.8mm2 pixel size, 800mm (vert.) by 1000mm (horiz.) by 200mm (perpendicularly to object) motion distances, ±20μm precision in positioning the system, 2x3m maximum object size (mounted vertically); 2.8kW x-ray tube; Si(Li)detector. PC's are used for instrument control and new, complex data evaluation software.Keywords
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