Lama III - A Computer Program for Quantitative XRFA of Bulk Specimens and Thin Film Layers
- 1 January 1983
- journal article
- Published by Cambridge University Press (CUP) in Advances in X-ray Analysis
- Vol. 27, 433-440
- https://doi.org/10.1154/s0376030800017365
Abstract
The previous LAMA I and II programs have been completely rewritten in this new version. Better precision and an order of magnitude increase in speed were achieved with a different numerical method and more efficient code. Fundamental parameters and/or empirical parameter calculations can be used. New routines for the analysis of oxides and other compounds of light elements, and multiple thin film layers with secondary enhancement factors are included.Keywords
This publication has 3 references indexed in Scilit:
- Quantitative X‐ray fluorescence analysis of thin films using LAMA‐2X-Ray Spectrometry, 1981
- Spectral distribution of x-ray tubes for quantitative x-ray fluorescence analysisAnalytical Chemistry, 1968
- Theoretical Calculation of Fluorescent X-Ray Intensities in Fluorescent X-Ray Spectrochemical Analysis.Japanese Journal of Applied Physics, 1966