Ellipsometry of mass-transport boundary layers
- 30 June 1976
- journal article
- Published by Elsevier in Surface Science
- Vol. 56, 440-448
- https://doi.org/10.1016/0039-6028(76)90464-7
Abstract
No abstract availableKeywords
This publication has 4 references indexed in Scilit:
- Reflection effects in interferometryApplied Optics, 1975
- Derivation of one-dimensional refractive-index profiles from interferogramsJournal of the Optical Society of America, 1975
- Fast self-compensating ellipsometerReview of Scientific Instruments, 1974
- Solutions for Colorimetric Standards. I. SPECTRAL TRAKSMISSION CURVES FOR SOME AQUEOUS SOLUTIONS CONTAINING ORGANIC INDICATORS OR INORGANIC SALTSThe Journal of Physical Chemistry, 1927