Analog CMOS integrated circuits for high-temperature operation with leakage current compensation

27 November 2002

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

p. 41-44
https://doi.org/10.1109/hitec.1998.676758

Abstract

To facilitate high-temperature operation of CMOS analog integrated circuits, we proposed new compensation circuits which compensated for PN-junction leakage current more precisely than conventional compensation circuits. As the result of applying these circuits to a voltage reference circuit, the operating temperature region was extended 20-40/spl deg/C.

Keywords

CMOS ANALOG INTEGRATED CIRCUITS
LEAKAGE CURRENT
DIODES
MOSFET CIRCUITS
TEMPERATURE DEPENDENCE
TEMPERATURE DISTRIBUTION
CMOS INTEGRATED CIRCUITS
RESEARCH AND DEVELOPMENT
THRESHOLD VOLTAGE
ANALOG INTEGRATED CIRCUITS

This publication has 1 reference indexed in Scilit:

Potential and problems of high-temperature electronics and CMOS integrated circuits (25–250°C) - an overview
Microelectronics Journal, 1991