Potential and problems of high-temperature electronics and CMOS integrated circuits (25–250°C) - an overview

This publication has 32 references indexed in Scilit:

• Design Consideration in High Temperature Analog CMOS Integrated Circuits
  IEEE Transactions on Components, Hybrids, and Manufacturing Technology, 1986
• Electrical Characteristics of Large-Scale Integration Silicon MOSFET's at Very High Temperatures,Part III: Modeling and Circuit Behavior
  IEEE Transactions on Components, Hybrids, and Manufacturing Technology, 1984
• Electrical characteristics of large scale integration (LSI) MOSFETs at very high temperatures part II: Experiment
  Microelectronics Reliability, 1984
• Electrical characteristics of large scale integration (LSI) MOSFETs at very high temperatures part I: Theory
  Microelectronics Reliability, 1984
• Fabrication and High-Temperature Characteristics of Ion-Implanted GaAs Bipolar Transistors and Ring-Oscillators
  IEEE Transactions on Industrial Electronics, 1982
• Performance of Digital Integrated Circuit Technologies at Very High Temperatures
  IEEE Transactions on Components, Hybrids, and Manufacturing Technology, 1980
• Integrated Circuit Characteristics at 260°C for Aircraft Engine-Control Applications
  IEEE Transactions on Components, Hybrids, and Manufacturing Technology, 1979
• Extension of High-Temperature Electronics
  IEEE Transactions on Components, Hybrids, and Manufacturing Technology, 1979
• Temperature dependence of MOS transistor characteristics below saturation
  IEEE Transactions on Electron Devices, 1966
• Temperature dependence of n-type MOS transistors
  IEEE Transactions on Electron Devices, 1965