Surface Film Formation by Chemical Vapor Deposition of Di-p-xylylene: Ellipsometrical, Atomic Force Microscopy, and X-ray Studies
- 2 February 2000
- journal article
- Published by American Chemical Society (ACS) in Langmuir
- Vol. 16 (6) , 2887-2892
- https://doi.org/10.1021/la9908743
Abstract
No abstract availableKeywords
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