The single event upset characteristics of the 486-DX4 microprocessor

Publisher Website

23 November 2002

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

https://doi.org/10.1109/redw.1997.629797

Abstract

No abstract available

Keywords

This publication has 2 references indexed in Scilit:

Spacecraft electronics design for radiation tolerance
Proceedings of the IEEE, 1988
A method for characterizing a microprocessor's vulnerability to SEU
IEEE Transactions on Nuclear Science, 1988