Experimental studies of atomic step contrast in reflection electron microscopy (REM)
- 31 December 1987
- journal article
- Published by Elsevier in Ultramicroscopy
- Vol. 22 (1-4) , 217-224
- https://doi.org/10.1016/0304-3991(87)90065-9
Abstract
No abstract availableKeywords
This publication has 10 references indexed in Scilit:
- The image contrast of surface steps in reflection electron microscopyUltramicroscopy, 1985
- Atomic and other structures of cleaved GaAs(110) surfacesSurface Science, 1984
- Observation of surface treatments on single crystals by reflection electron microscopyUltramicroscopy, 1984
- Reflection electron microscopy (REM) of vicinal surfaces of fcc metalsUltramicroscopy, 1983
- Reflection electron microscopy (REM) of fcc metalsUltramicroscopy, 1983
- Image contrast of dislocations and atomic steps on (111) silicon surface in reflection electron microscopySurface Science, 1981
- Observation of the Surface State Resonance Effect by the Convergent Beam RHEED TechniqueJournal of the Physics Society Japan, 1980
- Reflection electron microscopy of clean and gold deposited (111) silicon surfacesSurface Science, 1980
- Surface imaging using diffracted electronsSurface Science, 1976
- Resonance effects in low and high energy electron diffraction by crystalsActa Crystallographica Section A, 1970