Stability and soft error rates of SRAM cells

Publisher Website

1 January 1984

proceedings article
Published by Institute of Electrical and Electronics Engineers (IEEE)

https://doi.org/10.1109/isscc.1984.1156666

Abstract

No abstract available

Keywords

This publication has 2 references indexed in Scilit:

A 20 ns 64K (4Kx16) NMOS RAM
IEEE Journal of Solid-State Circuits, 1984
Alpha-particle-induced soft error rate modeling
Published by Institute of Electrical and Electronics Engineers (IEEE) ,1982