A study of secondary molecular ion formation in rare earth and rare earth oxides
- 1 January 1981
- journal article
- research article
- Published by Taylor & Francis in Radiation Effects
- Vol. 55 (1-2) , 57-65
- https://doi.org/10.1080/00337578108225466
Abstract
Secondary atomic and molecular ion energy spectra have been obtained for several rare earth and rare earth oxide samples. The energy dependencies of the diatomic ions were found to be a product of the energy dependencies of the atomic ions. Qualitative agreement of this product rule is also found for larger clusters. A recombination mechanism for molecular formation is demonstrated to be consistent with these results. Several preliminary ion implant studies are presented to give further insight into the recombination model.Keywords
This publication has 43 references indexed in Scilit:
- Clustering distances critical to metal dimer formation in the secondary ion mass spectra (SIMS) of cesium chlorideThe Journal of Chemical Physics, 1979
- Macromolecular ionic clusters of water detected by SIMSInternational Journal of Mass Spectrometry and Ion Physics, 1979
- Molecular rearrangement and cluster formation in the secondary ion mass spectra (SIMS) of fluoride saltsSurface Science, 1978
- Detection of high mass cluster ions sputtered from Bi surfacesChemical Physics Letters, 1976
- Thermodynamic approach to the quantitative interpretation of sputtered ion mass spectraAnalytical Chemistry, 1973
- Observation of clusters in a sputtering ion sourceRadiation Effects, 1973
- Theoretical models in secondary ionic emissionRadiation Effects, 1973
- Clusters sputtered from tungstenRadiation Effects, 1972
- Theory of Sputtering. I. Sputtering Yield of Amorphous and Polycrystalline TargetsPhysical Review B, 1969
- Multiatomic clusters emerging from a metal surface under ion bombardmentThe European Physical Journal A, 1969