Cellular structure and silicide formation in laser-irradiated metal-silicon systems

Abstract
Laser irradiation of thin Co, Mo, and Pd films on single‐crystalline silicon using Q‐switched Nd‐YAG laser pulses was shown by He backscattering to result in deep metal penetration into the Si. Evidence of the silicide formation was obtained by x‐ray diffraction. Transmission electron microscopy showed the simultaneous occurrence of two types of cells with metal‐rich walls: small cells of about 0.1‐μm diameter, attributed to rapid solidification from a supercooled melt, and larger cells of about 1‐μm diameter, attributed to convection in the melt (Bénard cells).