Quantitative analysis of sputtering due to ion beam bombardment of solids and biological specimens in high resolution electron microscopy
- 31 December 1992
- journal article
- Published by Elsevier in Micron and Microscopica Acta
- Vol. 23 (1-2) , 45-64
- https://doi.org/10.1016/0739-6260(92)90072-l
Abstract
No abstract availableKeywords
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