Testing for Single Intermittent Failures in Combinational Circuits by Maximizing the Probability of Fault Detection
- 1 May 1980
- journal article
- Published by Institute of Electrical and Electronics Engineers (IEEE) in IEEE Transactions on Computers
- Vol. C-29 (5) , 410-416
- https://doi.org/10.1109/tc.1980.1675595
Abstract
Intermittent faults in combinational circuits may appear and disappear randomly; hence, their detection requires many repeated applications of test vectors. Since testing reduces the time available for computation, it is necessary to efficiently minimize the time required for a test, while still achieving a high degree of fault detection.Keywords
This publication has 12 references indexed in Scilit:
- Testing for Single Intermittent Failures in Combinational Circuits by Maximizing the Probability of Fault DetectionIEEE Transactions on Computers, 1980
- Diagnosable Systems for Intermittent FaultsIEEE Transactions on Computers, 1978
- A Continuous-Parameter Markov Model and Detection Procedures for Intermittent FaultsIEEE Transactions on Computers, 1978
- Diagnosis of Intermittent Faults in Combinational NetworksIEEE Transactions on Computers, 1977
- A study of intermittent faults in digital computersPublished by Association for Computing Machinery (ACM) ,1977
- The Error Latency of a Fault in a Sequential Digital CircuitIEEE Transactions on Computers, 1976
- An Approach to the Diagnosis of Intermittent FaultsIEEE Transactions on Computers, 1975
- Intermittent Faults: A Model and a Detection ProcedureIEEE Transactions on Computers, 1974
- Testing for Intermittent Faults in Digital CircuitsIEEE Transactions on Computers, 1973
- Design and Use of Fault Simulation for Saturn Computer DesignIEEE Transactions on Electronic Computers, 1967