SNMS-analysis of insulators

This publication has 7 references indexed in Scilit:

• Quantitative chemical surface, in-depth, and bulk analysis by secondary neutrals mass spectrometry (SNMS)
  Journal of Vacuum Science & Technology A, 1985
• Molecule Formation in Oxide Sputtering
  Published by Springer Nature ,1982
• High-resolution sputter depth profiling with a low pressure hf plasma
  Applied Physics A, 1979
• Comparative SNMS and SIMS studies of oxidized Ce and Gd
  Surface Science, 1979
• Electron yields from clean polycrystalline metal surfaces by noble-gas-ion bombardment at energies around 1 keV
  Physical Review B, 1978
• Sputtered neutral mass spectrometry (SNMS) as a tool for chemical surface analysis and depth profiling
  Applied Physics B Laser and Optics, 1977
• Mass spectroscopy of sputtered neutrals and its application for surface analysis
  Surface Science, 1974