Sensitivity factors for XPS analysis of surface atoms
- 1 January 1983
- journal article
- research article
- Published by Elsevier in Journal of Electron Spectroscopy and Related Phenomena
- Vol. 32 (2) , 99-102
- https://doi.org/10.1016/0368-2048(83)85087-7
Abstract
No abstract availableThis publication has 11 references indexed in Scilit:
- Electron inelastic mean free paths in several solids for 200 eV ⩽ E ⩽ 10 keVSurface and Interface Analysis, 1982
- Empirical atomic sensitivity factors for quantitative analysis by electron spectroscopy for chemical analysisSurface and Interface Analysis, 1981
- Sensitivity factors, cross-section and resolution data for use with the Si Kα X-ray sourceJournal of Electron Spectroscopy and Related Phenomena, 1980
- Subshell photoionization cross-sections, electron mean free paths and quantitative X-ray photoelectron spectroscopyJournal of Electron Spectroscopy and Related Phenomena, 1980
- The energy dependence of the electron mean free pathSurface and Interface Analysis, 1980
- Relative photoelectron signal intensities obtained with a magnesium x-ray sourceAnalytical Chemistry, 1975
- Relative intensities in x-ray photoelectron spectra. Part IIJournal of Electron Spectroscopy and Related Phenomena, 1975
- Relative intensities in x-ray photoelectron spectraJournal of Electron Spectroscopy and Related Phenomena, 1973
- Sensitivity of detection of the elements by photoelectron spectrometryAnalytical Chemistry, 1972
- Relative intensities and widths of X-ray induced photo-electron signals from different shells in 72 elementsFaraday Discussions of the Chemical Society, 1972