EELS quantification of the elements Ba to Tm by means of N45 edges
- 1 December 1989
- journal article
- Published by Wiley in Journal of Microscopy
- Vol. 156 (3) , 279-283
- https://doi.org/10.1111/j.1365-2818.1989.tb02929.x
Abstract
No abstract availableKeywords
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