A novel very wideband 2‐port S‐parameter calibration technique
- 1 June 1990
- journal article
- research article
- Published by Wiley in Microwave and Optical Technology Letters
- Vol. 3 (6) , 210-212
- https://doi.org/10.1002/mop.4650030609
Abstract
In this article explicit formulas are presented permitting the de‐embedding of two‐port S‐parameter data in the case of the through‐reflect family of calibration techniques. The readily programmable algorithm developed is applied to a novel through‐attenuate‐reflect method (TAR) which, unlike the through‐reflect‐line method, has no inherent bandwidth limitation.Keywords
This publication has 3 references indexed in Scilit:
- A unified mathematical approach to two-port calibration techniques and some applicationsIEEE Transactions on Microwave Theory and Techniques, 1989
- Thru-Reflect-Line: An Improved Technique for Calibrating the Dual Six-Port Automatic Network AnalyzerIEEE Transactions on Microwave Theory and Techniques, 1979
- A New Procedure for System Calibration and Error Removal in Automated S-Parameter MeasurementsPublished by Institute of Electrical and Electronics Engineers (IEEE) ,1975