A universal framework for managed built-in test

30 December 2002

conference paper
Published by Institute of Electrical and Electronics Engineers (IEEE)

p. 21-29
https://doi.org/10.1109/test.1993.470722

Abstract

An approach to systems test is presented that builds on earlier work by several design-for-test and test management standards committees and research teams. The approach is based on a generic model of a managed built-in test process supported by standard test descriptions.

Keywords

BUILT-IN SELF-TEST
SYSTEM TESTING
CIRCUIT TESTING
PRINTED CIRCUITS
ASSEMBLY SYSTEMS
LIFE TESTING
COSTS
STANDARDS DEVELOPMENT
PERFORMANCE EVALUATION
CIRCUIT FAULTS

This publication has 3 references indexed in Scilit:

HIST: A METHODOLOGY FOR THE AUTOMATIC INSERTION OF A HIERARCHICAL SELF TEST
Published by Institute of Electrical and Electronics Engineers (IEEE) ,2005
A Proposed Method of Accessing 1149.1 in a Backplane Environment
Published by Institute of Electrical and Electronics Engineers (IEEE) ,2005
A Framework for Boundary-Scan Based System Test and Diagnosis
Published by Institute of Electrical and Electronics Engineers (IEEE) ,2005