Influence of the Flux Creep on the Critical Current Density in Bi2Sr2Ca2Cu3Ox and Y(Ho)Ba2Cu3Oy Superconductors
- 1 September 1990
- journal article
- Published by IOP Publishing in Japanese Journal of Applied Physics
- Vol. 29 (9A) , L1652
- https://doi.org/10.1143/jjap.29.l1652
Abstract
Intragrain J c values of the textured Bi- and Y-based oxides were obtained at 4.2 K–77 K by the D.C. magnetization measurements with various sweep rates of the magnetic field. The J c's at 4.2 K were comparable for both oxides. However, with increasing temperature, the J c of the Bi-based oxide became much more sensitive to the electric field criterion E c related to the sweep rate of the magnetic field than that of the Y-based oxide. As a result, J c at 77 K of the Bi-based oxide was significantly decreased in magnetic fields for small E c. The dependence of J c on E c for both oxides can be well understood using the flux creep model.Keywords
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