Infrared Polariscope For Photoelastic Measurement of Semiconductors
- 1 November 1965
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 4 (11) , 1475-1478
- https://doi.org/10.1364/ao.4.001475
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
This publication has 3 references indexed in Scilit:
- Infrared Studies of Birefringence in SiliconJournal of Applied Physics, 1959
- Strain-Optic Coefficient of Silicon for Infrared LightJournal of Applied Physics, 1959
- Birefringence Caused by Edge Dislocations in SiliconPhysical Review B, 1958