Polycrystalline film target texture and nuclear backscattering analysis
- 1 March 1978
- journal article
- Published by Elsevier in Nuclear Instruments and Methods
- Vol. 149 (1-3) , 247-251
- https://doi.org/10.1016/0029-554x(78)90868-6
Abstract
No abstract availableKeywords
This publication has 8 references indexed in Scilit:
- Multiple scattering of heavy ions of keV energies transmitted through thin filmsPhysical Review A, 1974
- X-ray study of interdiffusion in bimetallic Cu–Au filmsJournal of Applied Physics, 1972
- Multiple scattering of heavy ions of keV energies transmitted through thin, polycrystalline gold foilsRadiation Effects, 1972
- A radiotracer technique for measuring the reflection of heavy ions (of keV energies) from solid surfacesRadiation Effects, 1971
- Seeman–Bohlin X-ray diffractometer for thin filmsJournal of Applied Crystallography, 1970
- Preferred orientation in metal films deposited on glassThin Solid Films, 1970
- Collection and sputtering experiments with noble gas ionsNuclear Instruments and Methods, 1961
- X. Quantitative measurement of preferred orientation in rolled uranium barsJournal of Computers in Education, 1952