In situ STM characterisation of Ga+ focused ion beam interactions with MBE grown GaAs(100)
- 1 May 1997
- journal article
- Published by Elsevier in Journal of Crystal Growth
- Vol. 175-176, 346-351
- https://doi.org/10.1016/s0022-0248(96)01185-2
Abstract
No abstract availableKeywords
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