The Application of Intensity Transients in Ellipsometry
- 1 July 1970
- journal article
- Published by Optica Publishing Group in Applied Optics
- Vol. 9 (7) , 1634-1638
- https://doi.org/10.1364/ao.9.001634
Abstract
Optics InfoBase is the Optical Society's online library for flagship journals, partnered and copublished journals, and recent proceedings from OSA conferences.Keywords
This publication has 8 references indexed in Scilit:
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- Optical Studies of the Formation and Breakdown of Passive Films Formed on Iron Single Crystal Surfaces in Inorganic Inhibitor SolutionsJournal of the Electrochemical Society, 1963
- Determination of the Properties of Films on Silicon by the Method of EllipsometryJournal of the Optical Society of America, 1962